Signaling system with low-power automatic gain control

ABSTRACT

An integrated circuit device includes a variable-gain amplifier, memory circuit and gain control update circuit. The variable-gain amplifier generates an amplified signal having an amplitude according to a gain control value that is stored, at least during a first interval, within the memory circuit. The update circuit generates an updated gain control value based on the amplified signal during the first interval, and outputs the updated gain control value to the memory circuit to be stored therein at a conclusion of the first interval.

TECHNICAL FIELD

The present invention relates to low-power signaling systems.

BACKGROUND

Automatic gain control (AGC) circuits are widely used to achievecontrolled signal amplification in electronic systems. In a typicalprior-art AGC circuit, depicted in FIG. 1, an input signal 102 isamplified by a variable-gain amplifier 101 (VGA) to produce an amplifiedsignal 104 that is both output from the AGC circuit and supplied to again control loop 103. The gain control loop 103 conventionally includesan envelope detector 105 to detect the peak amplitude of the amplifiedsignal 104, and a comparator 107 to compare the peak amplitude to adesired amplitude 108 and thus generate an error signal 106 that isapplied within a filter circuit 109 to adjust the gain of thevariable-gain amplifier 101 (i.e., adjust a gain control signal 110) ina direction counter to the error. Thus, the variable-gain amplifier 101and gain control loop 103 collectively form a negative-feedback circuitthat attempts to minimize the error between the desired and amplifiedsignal levels, thereby achieving a desired signal amplification.

One major drawback to the AGC circuit of FIG. 1, is that the gaincontrol loop 103 operates without interruption and thus consumes powercontinuously. Such continuous power consumption renders the AGC circuitof FIG. 1 increasingly unsuitable for application in thepower-constrained environment of modern integrated circuits (ICs) andelectronics devices, and particularly in modern IC signaling interfaceswhere thermal considerations and ever-increasing input/output (I/O)count continue to shrink I/O power budgets.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention is illustrated by way of example, and not by wayof limitation, in the figures of the accompanying drawings and in whichlike reference numerals refer to similar elements and in which:

FIG. 1 illustrates a prior-art automatic gain control (AGC) circuit;

FIG. 2 illustrates an embodiment of a low-power AGC circuit;

FIG. 3 illustrates an alternative embodiment of a low-power AGC circuit;

FIGS. 4A and 4B illustrate operation of an exemplary pulse-codedsignaling system in which embodiments of low-power AGC circuits may beapplied;

FIGS. 5A-5C illustrate an embodiment of a pulse-coded signal receiverand operation of amplifier and detector components therein;

FIGS. 6A and 6B illustrate embodiments of inverter-based amplifiers thatmay be used to implement the variable-gain amplifier depicted in FIG.5A;

FIG. 7 illustrates a more detailed embodiment of a pulse-coded signalreceiver that may be used to implement the pulse-coded signal receiverof FIG. 5A;

FIG. 8 illustrates is a graph of pulse detection versus gain andillustrates the relationship between the height of amplified pulses anda gain control setting that results in detection of half the pulses in apulse-coded input signal;

FIG. 9 illustrates an exemplary flow diagram for operation of thecontroller depicted in FIG. 7;

FIG. 10 illustrates an alternative embodiment of a pulse-coded signalreceiver;

FIG. 11 illustrates an exemplary gain control update operation that maybe carried out by the controller depicted in FIG. 10;

FIGS. 12A and 12B illustrate exemplary embodiments of edge detectorsthat may be used to implement the data-edge and sense-edge detectorsdepicted in FIG. 7 and the edge detector depicted in FIG. 10;

FIGS. 13A and 13B illustrate an alternative technique for determining again control value to be applied within a variable-gain amplifier; and

FIG. 14 illustrates an exemplary approach that may be applied within thesignal receiver of FIG. 7 to determine a gain control value at whichestimated false-negative and false-positive rates balance.

DETAILED DESCRIPTION

Low-power automatic gain control (AGC) circuits are disclosed in variousembodiments along with devices and systems incorporating such circuits.In one embodiment, a storage circuit referred to herein as a gaincontrol memory is provided to store a gain control value generated by anupdate loop within an AGC circuit, and to output the gain control valueto a variable-gain amplifier. By this arrangement, after the gaincontrol value has been adjusted to achieve a desired amplification levelwithin the variable-gain amplifier, the update loop or portions thereofmay be disabled to save power, leaving the gain control memory tomaintain the gain control value and thus the desired amplificationlevel. Thereafter, the update loop may be periodically or occasionallyre-enabled to compensate for drift in the desired amplification leveldue, for example, to changes in temperature or voltage.

In one implementation, the update loop within the AGC generates ananalog gain control signal which is converted to digital form (i.e., adigital gain control value) before being provided to the gain controlmemory. The gain control memory may include a digital-to-analogconverter (DAC) to perform a counterpart digital-to-analog conversionand thus output an analog gain control signal to the variable-gainamplifier or, alternatively, the variable-gain amplifier may itselfinclude digital gain control circuitry and therefore may receive thedigital gain control value directly from the gain control memory. Forexample, the variable-gain amplifier may include one or moredigital-to-analog converters that operate as amplifier biasing circuitsand thus control amplifier gain.

In another implementation, the update loop within the AGC circuit isentirely or predominantly digital thus forming a digital AGC circuitthat includes, for example, an analog-to-digital converter (ADC) togenerate a sequence of digitized samples of the amplified signal, and adigital update circuit to process the samples into a correspondingsequence of updated digital gain control values. The updated digitalgain control values may be stored one after another in the gain controlmemory and thus sequentially applied to control the gain of thevariable-gain amplifier.

In one embodiment, a digital AGC circuit is applied within a signalreceiver to amplify a pulse-coded input signal to a level that enablesinformation-bearing pulses in the incoming signal to be distinguishedfrom noise. In a particular implementation, the AGC circuit is used toadaptively determine a gain control value that establishes the medianamplitude of the incoming pulses at the threshold of a level-detectingcircuit, thus enabling an operating gain control value to be determined,for example, as a multiple of the median-detection gain control value.In another implementation, the gain control value is stepped through asequence of below-nominal values to estimate a false-negative bit errorrate as a function of gain by determining respective numbers ofnon-detected input signal transitions at the different gain controlvalues, and is similarly stepped through a sequence of above-nominalvalues to estimate a false-positive bit error rate as a function ofrespective numbers of spurious input signal transitions detected at thedifferent gain control values. A gain control setting that yields atheoretically balanced false-positive and false-negative bit error ratemay then be determined and applied within the variable-gain amplifier toachieve the desired amplification level. In both implementations, theAGC circuit or components thereof may be disabled to save power once adesired gain control value has been determined and stored in the gaincontrol memory. These and other embodiments, features and aspects of theinvention are described in further detail below.

FIG. 2 illustrates an embodiment of a low-power AGC circuit 150 that maybe used within an input signal receiver of an integrated circuit deviceor in any other application in which low-power automatic gain control isdesirable. As shown, the AGC circuit 150 includes a variable-gainamplifier 151, update circuit 153 and gain control memory 161. Thevariable-gain amplifier 151 amplifies an input signal 152 in accordancewith a gain control value 162 (GC) received from the gain control memory161 to produce an amplified signal 154. The amplified signal 154 isoutput from the AGC circuit 150 (for example, for use by other circuitrywithin the integrated circuit device) and is also supplied to the updatecircuit 153. In general, the update circuit 153 compares the amplifiedsignal level to a desired signal level to generate an updated gaincontrol value, referred to herein as a gain control update 160 (GC′),which is periodically or occasionally stored within the gain controlmemory 161 to establish a new, adjusted gain control value 162. In oneembodiment, control circuitry, not shown in FIG. 2, is provided todetermine when the amplified signal has stabilized at a desired signallevel (or within a desired range of signal levels), for example, bydetecting dithering of the gain control value 162 (or gain controlupdate 160). The control circuitry may respond to detection of thestabilized condition by asserting an inhibit signal 166 to disableoperation of the update circuit 153 and thus conserve power. Thereafter,the inhibit signal 166 may be occasionally or periodically deasserted(e.g., during calibration intervals or in response to threshold errordetection, commands from a remote control device or other conditionswhich indicate need to adjust the gain control value) to enable theautomatic gain control operation of the update circuit 153.

In the particular embodiment of FIG. 2, the update circuit 153 includesan envelope detector 155, comparator 157 and filter 159. The envelopedetector 155, which may be implemented, for example by a diode and ashunt capacitor (or by any other envelope-detecting circuit), detects apeak level of the amplified signal 154 (which may be a relative minimumor maximum, or both) and outputs the peak signal level 158 to thecomparator 157. The comparator 157 compares the peak signal level 158with a desired signal level 180 and generates an error signal 156 thatindicates whether the peak signal level 158 exceeds or does not exceedthe desired signal level 180. The comparator 157 may be implemented, forexample and without limitation, by a differential amplifier oroperational amplifier that generates an error signal 156 having a signand magnitude according to the sign and magnitude of the differencebetween the peak and desired signal. Alternatively, the comparator 157may generate a bi-stable error signal 156 that is high or low accordingto the sign of the difference between the peak and desired signallevels.

The error signal 156 is provided to the filter circuit 159 which mayinclude any number of passive or active components to filter the errorsignal 156 (e.g., smooth, average or otherwise suppress transients) andstabilize the gain control loop formed by the update circuit 153, gaincontrol memory 161 and variable-gain amplifier 151. The output of thefilter 159 is referred to herein as a gain control update 160 (GC′) andis supplied to the gain control memory 161 to be stored therein inresponse to a load-enable signal 164 (LE).

In one embodiment, the load-enable signal 164 and inhibit signal 166 areeach controlled by a control circuit or timing circuit within the hostintegrated circuit device (i.e., the integrated circuit device thatincludes the AGC circuit 150) and may be asserted periodically or inresponse to various operating conditions or events. For example, in aparticular implementation, the load-enable signal 164 is asserted at theconclusion of each of a sequence of error detection intervals for whichthe inhibit signal 166 is deasserted. The error detection intervals maybe established by a clock cycle count (e.g., counting a predeterminednumber of clock cycles) or input signal transitions (e.g., counting apredetermined number of input signal transitions) or any otherinterval-control technique. The load-enable signal 164 and/or inhibitsignal 166 may alternatively be controlled by circuitry external to thehost integrated circuit device.

The gain control memory 161 may be implemented by any type of volatileor non-volatile memory circuit, including a digital storage circuit suchas a multi-bit register (or latch) or an analog memory element. In oneembodiment, shown in detail view 163, the memory circuit 161 includes adigital storage circuit 165 (Reg) to store a digital gain control update178 (GC′(d)) in response to assertion of load-enable signal 164, and adigital-to-analog converter 167 (DAC) to convert the contents of thedigital storage circuit 165 to an analog gain control signal 162 (GC).In such an embodiment, the filter circuit 159 may include ananalog-to-digital converter 177 (ADC) as shown in detail view 171 toconvert an analog gain control update 176 (GC′(a)) received from ananalog filter circuit 175 to digital gain control update 178.

Still referring to FIG. 2, when the inhibit signal 166 is asserted, theenvelope detector 155, comparator 157, filter 159 or any subset thereofmay be disabled to save power. More specifically, power to one or moreof the operational circuits within any or all of the detector 155,comparator 157 and filter 159, may be switched off, and/or input signaltransitions to such circuits suppressed (e.g., by decoupling suchcircuits from a signal input path and/or discharging the input node ofthe circuits). The load-enable signal 164 may be disabled from beingasserted when the inhibit signal 166 is asserted, thereby preventinginvalid gain control updates 160 from being loaded into gain controlmemory 161.

In an embodiment in which analog filter components are used to implementfilter 159, assertion of the inhibit signal 166 may result in loss offilter memory (e.g., discharge of discrete components therein) so that,if the inhibit signal 166 is later deasserted to enable operation of theupdate circuit 153, the load-enable signal 164 may remain deasserted fora number of error detection intervals after inhibit signal deassertionto enable the filter memory to be restored before loading gain controlupdates 160 into the gain control memory 161, thereby reducing thechance of loading an invalid gain control update.

FIG. 3 illustrates an embodiment of a low-power AGC circuit 200 having avariable-gain amplifier 201, digital update circuit 203 and gain controlmemory 215. As in the embodiment of FIG. 2, the variable-gain amplifier201 amplifies an input signal 152 in accordance with a gain controlvalue 210 (GC) to generate an amplified signal 154. The digital updatecircuit 203 includes, as component circuits, an analog-to-digitalconverter 205 (ADC), digital detector 207, digital comparator 209 anddigital filter 211, and is coupled to receive the amplified signal 154as well as a sample signal 212 and frame signal 214 that are used totrigger operation of the component circuits. More specifically, the ADC205 responds to assertions of the sample signal 212 by generatingrespective digital samples 202 of the amplified signal 154 (e.g., amultiple-bit value that indicates the amplitude or relative amplitude ofthe amplified signal) and thus supplies a sequence of digital samples tothe digital detector 207. The digital detector 207 determines the peakdigital sample (which may include a maximum and/or minimum sample)within the sequence of digital samples 202 output from the ADC 205 overan error detection interval marked by successive assertions of framesignal 214. In one embodiment, for example, the digital detector 207includes a temporary buffer and comparison logic that are used todetermine the peak digital sample for a given error detection interval,and a peak-sample buffer that is used to hold the peak digital sampledetermined during the immediately preceding error detection interval. Ingeneral, each digital value generated by the ADC 205 during a givenerror detection interval is compared with the contents of the temporarybuffer (i.e., through operation of the comparison logic) and, ifdetermined to exceed the temporary buffer contents, is stored within thetemporary buffer as the peak value so far detected within the errordetection interval. At each frame signal assertion, the peak valuerecorded within the temporary buffer is transferred to the peak-samplebuffer and the temporary buffer is reset (e.g., to a value sure to bematched or exceeded by an incoming digital sample 212 during the ensuingerror detection interval).

At each assertion of frame signal 214, the digital comparator 209compares the peak sample 204 recorded by the digital detector 207 (i.e.,received from the peak-sample buffer therein) with a desired peak value213 to generate an updated error signal 206. The desired peak value 213may be, for example, a hardwired digital value or a digital value storedwithin a volatile or non-volatile register (e.g., a programmableregister) of the host integrated circuit device. Also, in oneembodiment, the error signal 206 includes a sign bit that indicateswhether the peak sample 204 exceeds the desired peak value 213 orvice-versa and may additionally include a magnitude component thatindicates a magnitude of the difference between the peak sample 204 anddesired peak value 213. In either case, the updated error signal 206 issupplied to the digital filter 211 which responds to each assertion ofthe frame signal 214 by applying the updated error signal 206 in afiltering operation to generate a filtered gain control update 208(GC′). In one embodiment, the digital filter 211 is a finite impulseresponse filter that applies the updated error signal 206 in a filteringoperation along with a finite number of the most recently received errorsignals 206. In an alternative embodiment, the digital filter may beimplemented by an infinite impulse response filter that accumulates theupdated error signal 206 into a running total (e.g., a running average).More generally, the digital filter 211 may be any type of filter and mayperform any number of operations to smooth, average or otherwisesuppress transients of the error signal 206 and to stabilize the gaincontrol loop.

In one embodiment, a load-enable input of the gain control memory 215 iscoupled to receive a load-enable signal 216 that, at least initially, isasserted in response to (or coincidentally with) each frame signal 214to load the updated gain control value 208 into the gain control memory215 and thereby iteratively adjust the gain control value 210 suppliedto the variable-gain amplifier 201. As shown, the variable-gainamplifier 201 may include a DAC 220 to receive a digital gain controlvalue 210 from the gain control memory 215 (e.g., implemented by aregister, latch or the like) and to control amplification within thevariable-gain amplifier 201 accordingly. Alternatively, the DAC 220 maybe included within or considered to be part of the gain control memory215.

Still referring to FIG. 3, it should be noted that sample signal 212 andframe signal 214 may each be asserted periodically so that the AGCcircuit 200 may be operated without interruption. Alternatively, thesample signal 212 and frame signal 214 (which may be asserted once forevery N sample signal assertions according to the desired number ofdigital samples per error detection interval) may be held at asteady-state to prevent operation of the update circuit 203, thusmaintaining the gain control value 210 most recently stored within thegain control memory 215 to control the gain of the variable-gainamplifier 201 and effecting a low power mode of operation within the AGCcircuit 200. Thereafter, cycling of the sample signal 212 and framesignal 214 may occasionally be enabled, for example, to restore AGCoperation and thus compensate for drift between the desired and actualgains within the variable-gain amplifier 201. As with the AGC circuit150 of FIG. 2, it may be desirable to operate the update circuit 203 fora limited number of error detection intervals before enabling assertionof the load-enable signal 216 to enable the digital filter 211 to beprimed by a fresh set of error signals 206. Also, the digital samples202 generated by ADC 205 constitute an amplified digital signal that maybe supplied to other components within the host integrated circuitdevice, for example, as an alternative to (or in addition to) amplifiedsignal 154. Alternatively, one or more additional ADC circuits may beprovided to generate digital samples of the amplified signal 154 for usewithin other circuit components of the host integrated circuit device.

FIGS. 4A and 4B illustrate operation of an exemplary pulse-codedsignaling system 240 in which embodiments of low-power AGC circuits maybe applied. Referring first to FIG. 4A, the signaling system 240includes a pair of integrated circuit devices 241 and 243 interconnectedby a signaling path 249. In the particular embodiment shown, integratedcircuit device 241 includes a pulse-coded transmitter 245 to outputtransmit data (Tx Data) 245 onto the signaling path, and integratedcircuit device 243 includes a pulse-coded receiver 247 to recoverreceive data (Rx Data) from the pulse-coded transmission. Though aunidirectional signaling link is depicted, integrated circuit device 241may additionally include a pulse-coded receiver coupled to signalingpath 249, and integrated circuit device 243 may include a counterpartpulse-coded transmitter coupled to signaling path 249. Alternatively,separate unidirectional signaling links may be provided for pulse-codedsignal transmission and reception. Also, other pulse-coded transmittersand/or receivers may be provided within the integrated circuit devices241 and 243 to establish n-bit wide signaling paths that may be used toconvey data words, command words, address values and/or any otherinformation to be conveyed between the integrated circuit devices.Further, while contact pads 246 and 248 are depicted as interconnectnodes between the external signal path 249 and on-die segments of thesignal path 249, any type of signal interconnection structures may beused as signal input/output (I/O) nodes, including contactlessinterconnects through which signals may be capacitively or inductivelycoupled. Further, on-die and/or off-die termination structures may bepermanently or switchably coupled to the signaling path 249 to effect acontrolled impedance (e.g., to establish transmission linecharacteristics) over the signaling path 249, and one or more additionalsignaling paths may be provided to convey timing information (e.g.,clock or strobe signals) for establishing signal transmission and/orreception times within the integrated circuit devices. The integratedcircuit devices 241 and 243 themselves may be separately packaged anddisposed on a common printed circuit board or on separate printedcircuit boards (e.g., on respective daughterboards interconnected by abackplane or motherboard, or on a motherboard and daughterboard), ordisposed within a common integrated circuit package such as a multi-chipmodule, paper-thin package, system-on-chip, system-in-package, etc.Also, instead of being disposed on separate integrated circuit dice(also referred to herein as chips), the transmitter 245 and receiver 247may be disposed on a common die and the signal path 249 formed in one ormore conductive layers (e.g., metal layers) of the die. The signalingsystem 240 may be included within any type of electronic system in whichchip-to-chip signaling is required including, for example and withoutlimitation, various types of computing devices and consumer electronicsdevices (e.g., computers, networking devices, cell phones, mediaplayers, handhelds, televisions, set-top boxes, etc.).

FIG. 4B illustrates an exemplary sequence of transmit data bits 250, andcorresponding binary-coded and pulse-coded waveforms 251 and 252. Thebinary-coded waveform 251 is also referred to as a non-return to zero(NRZ) waveform as the output signal is at all times either high or lowto represent the corresponding transmit data bit. Thus, the waveform islow during the first two transmission intervals shown, 255 and 256, totransmit sequential logic ‘0’ data bits, then goes high in transmissioninterval 256 to transmit a logic ‘1’ bit. Thereafter, the waveformremains high to transmit a sequence of logic ‘1’ bits, and then goes lowagain in transmit interval 262 to transmit a sequence of logic ‘0’ databits. A maximum signal switching frequency occurs whenever a logic ‘1’data bit is transmitted between two logic ‘0’ data bits as in transmitinterval 265, or when a logic ‘0’ data bit is transmitted between twologic ‘1’ data bits as in transmit interval 266.

In the pulse-coded waveform 252, positive and negative pulses aretransmitted to signal changes in the transmit data state. That is, eachtransmit data transition from a logic ‘0’ to a logic ‘1’ state issignaled by a positive pulse as shown in transmit intervals 257 and 265,and each transmit data transition from a logic ‘1’ to a logic ‘0’ stateis signaled by a negative pulse as shown at transmit intervals 262 and266. No pulses are transmitted during sequences of same-state transmitdata as, for example, between transmit intervals 257 and 262. By thissignal-encoding arrangement, referred to herein as pulse-coding (ordelta encoding, as only data-state changes in the transmit data bitstream are explicitly signaled), the total signaling power may besubstantially reduced due to the reduced number of signal driving eventsin the pulse-coded transmitter. That is, because the probability of agiven transmit data bit being succeeded by a same-state transmit databit is 50% (i.e., assuming a random and continuous stream of transmitdata bits 250), the number of signal driving events (i.e., where asignal is actually being driven onto signal path 249 by the transmitcircuit) is theoretically reduced by 50%. Where a long stream of logic‘1’ or logic ‘0’ data is to be transmitted (e.g., during a quiet periodon the signaling link), the transmit power consumption may dropconsiderably further.

In FIG. 4B, the positive and negative pulses are depicted as capacitorcharge/discharge waveforms to emphasize the capacitive nature of thesignaling path. The pulses may have various different shapes accordingto the signaling path characteristics, output and input impedances atthe transmitter and receiver, and signal equalization applied within thetransmitter and/or receiver (e.g., transmit pre-emphasis and/ordecision-feedback equalization). Also, while depicted as single-endedsignals in FIG. 4B and generally described as such in embodimentsdetailed below, in all such cases, the pulse-coded signal 252 mayalternatively be a differential signal formed by complementary componentsignals and the signaling-system components modified to accommodatedifferential signal transmission and reception.

FIGS. 5A-5C illustrate an embodiment of a pulse-coded signal receiver270 and operation of amplifier and detector components therein.Referring first to FIG. 5A, pulse-coded signal receiver 270 includes avariable-gain amplifier 275, hysteretic detector 277, and digital AGCcircuit 279. The variable-gain amplifier 275 amplifies a pulse-codedinput signal 274 in accordance with a gain control value 280 (GC) fromAGC circuit 279 to deliver an amplified signal (AS) 276 to thehysteretic detector 277. In one embodiment, shown at 281, the hystereticdetector 277 is implemented by a pair of inverters 283 and 285 coupledin a flip-flop configuration (i.e., output of each inverter coupled toinput of the other) and may thus be toggled between bi-stable states(i.e., logic ‘0’ to logic ‘1’ or logic ‘1’ to logic ‘0’) in response topositive and negative pulses in the amplified signal. More specifically,as shown in FIG. 5B, a positive pulse that exceeds a positive (0-to-1)toggle threshold (TT₀₁) will cause the detector 277 to toggle from alogic ‘0’ state to a logic ‘1’ state as shown at 301, and a negativepulse that exceeds a negative (1-to-0) toggle threshold (TT₁₀) willcause the detector to toggle from a logic ‘1’ state to a logic ‘0’ stateas shown at 302. That is, in the 0-to-1 transition, the amplified signal276 rises to a level that overcomes the logic ‘0’ output of inverter 283(i.e., above the positive toggle threshold), thus causing the detector277 (i.e., the storage element formed by the inverter pair) to flip tothe alternate bi-stable state. Conversely, in the 1-to-0 transition, theamplified signal 276 drops to a level that overcomes the logic ‘1’output of inverter 285 (i.e., below the negative toggle threshold), thuscausing the detector state to toggle. Note that the output of thedetector 277 is inverted relative to the state stored therein (i.e.,considering the stored state to be the signal level at the output ofinverter 285, which corresponds to the most recently captured state ofthe amplified signal 276) due to the inversion performed by inverter283. Though not shown in FIG. 5A, an additional inverter may be providedat the output of detector 277 to establish equivalence between capturedand output states of detector 277. In any case, the bi-stable nature ofthe detector 277 provides hysteresis in the transition between thebi-stable states of the detector 277 so that the detector output 278(i.e., the received data signal 278) does not change states in absenceof pulses that exceed the upper or lower toggle thresholds. Also, bypowering the component inverters of the detector 277 with logic levelsupply and ground voltages, the resulting detector output signal 278 isa logic-level signal having either a logic ‘0’ or logic ‘1’ data statein each data reception interval. Accordingly, so long as incomingpositive and negative pulses are amplified to levels that exceed thepositive and negative toggle thresholds TT₀₁ and TT₁₀, withoutamplifying noise beyond those levels, the signal receiver 243 willrecover a stream of receive data bits from the incoming pulse-codedsignal 274 that corresponds to the original transmit data stream.

Returning to FIG. 5A, the variable-gain amplifier 275 may be implementedby virtually any type or number of amplifier stages. In one embodiment,shown for example in detail view 291, each stage of the variable-gainamplifier 275 is implemented by an inverter 293 having afeedback-coupled resistive element 295 (which may be a resistor or anactive load) to establish a DC bias point at the center of the linearamplification region of the inverter as shown in FIG. 5C. Each amplifierstage or any of the stages may include an input capacitor 297 (e.g.,formed by a capacitor-configured transistor) and thus be AC-coupled tothe preceding stage or input signal node. In a particularimplementation, the incoming pulse-coded signal may range from roughly±3 mV to ±100 mV and may need to be amplified to levels as high as ±1volt or beyond. Accordingly, as the inverting amplifier shown at 291generally exhibits a gain less than 10, multiple inverting amplifierstages 291 may be coupled in series to provide the necessary gain, withbypass options for one or more of the stages (e.g., switchable shuntpaths) to accommodate lower gains.

FIGS. 6A and 6B illustrate embodiments of inverter-based amplifiers (325and 355) that may be used to implement the variable-gain amplifier 275of FIG. 5A. Referring first to FIG. 6A, a series of inverting amplifierstages (327 ₀, 327 ₁, 327 ₂, etc.) are coupled in series, with a finalamplifier stage 329 having biasing DACs 340 and 342 coupled between thesupply voltage nodes and inverting transistors 330 and 331 to form acurrent-starved inverter stage. To extend the amplification range of themulti-stage amplifier, shut-down transistors 332 and 333 and bypasstransistors 335 and 337 may be included in one or more of stages 327 toenable the stages to be selectively bypassed, for example, in responseto a programmed mode bypass control value, Byp[k−1:0], where k is thenumber of bypass-able stages 327. In the detail view of invertingamplifier stage 327 ₀, for example, when a bypass signal, Byp₀, israised (and complementary signal /Byp₀ lowered), shut-down transistors332 and 333 are switched off to disable operation of the inverter formedby transistors 330 and 331, and the transfer gate formed by passtransistors 335 and 337 is switched on to conduct the incoming signal tothe input of the subsequent inverting amplifier stage 327 ₁, thusbypassing the inverting amplifier stage 327 ₀. Other bypass arrangementsmay be used in alternative embodiments.

In one embodiment, biasing DAC 340 within the final amplifier stage 329is formed by N binary-weighted transistors 341 ₀-341 _(N−1) (e.g.,having progressively doubled width/length ratios (W/L) such that W/L ofeach of the transistors 341 _(i) is given by 2^(i+1)×W/L_(MIN), where iranges from 0 to N−1 and W/L_(MIN) is the width/length ratio of thesmallest transistor 341 ₀) having grounded source terminals, commonlycoupled drain terminals and gate terminals coupled to receive respectivebits of gain control value GC[N−1:0]. Biasing DAC 342 is similarlyformed by binary-weighted transistors 343 ₀-343 _(N−1) havingsupply-coupled source terminals, commonly coupled drain terminals andgate terminals coupled to receive respective bits of complementary gaincontrol value /GC[N−1:0]. In this arrangement, the biasing transistors341 ₀-341 _(N−1) may be viewed collectively as a variable-width n-MOStransistor (i.e., n-type metal oxide semiconductor transistor) andbiasing transistors may similarly be viewed collectively as avariable-width p-MOS transistor. That is, as the gain control value, GC,is incremented or decremented, the width of the collective transistorformed by transistors 341 and the width of the collective transistorformed by transistors 343 is incremented or decremented accordingly toincrease or decrease the gain of the final amplifier stage. Inalternative embodiments, thermometer coding or other techniques may beused to achieve effective binary weighting of the paths controlled byrespective bits of the gain control value. Also, non-binary weightingschemes such as linear weighting (all transistors 341 and/or 343 thesame size), exponential weighting, and so forth, may be used inalternative embodiments. As shown, in an alternative embodiment,separate positive and negative gain control values, pGC[N−1:0] andnGC[N−1:0], may be provided to control DACs 340 and 342, thus enablingseparate gain control for amplification of positive pulses (amplifiedprimarily by the setting of DAC 340) and negative pulses (amplifiedprimarily by the setting of DAC 342).

FIG. 6B illustrates an alternative embodiment of a variable-gainamplifier 355 formed by parallel-coupled current-starved inverters 360₀-360 _(N−1). More specifically, the signal inputs of thecurrent-starved inverters 360 are coupled to a common input node 326,and the signal outputs of the inverters 360 are coupled to a commonoutput node 364, and a resistive element 373 is coupled between theinput and output nodes to establish a DC bias point. By thisarrangement, the core inverters formed by transistors 361 ₀-361 _(N−1)and 363 ₀-363 _(N−1) form, collectively, a high-gain inverter element(i.e., the constituent transistors 361 ₀-361 _(N−1) and 363 ₀-363 _(N−1)are ganged to provide high transconductance ratios). Transistors 365₀-365 _(N−1) and 367 ₀-367 _(N−1) form positive and negativegain-control DACs, respectively, that control the applied voltage acrossthe core inverter transistors 361 ₀-361 _(N−1) and 363 ₀-363 _(N−1), andthus control the overall gain of the amplifier. In one embodiment, thepositive gain-control DAC is implemented by binary weighted n-MOStransistors 365 coupled to receive respective bits of gain controlvalue, GC[N−1:0], and the negative gain-control DAC is similarlyimplemented by binary weighted p-MOS transistors 367 coupled to receiverespective bits of complement gain control value, /GC[N−1:0]. As in theembodiment of FIG. 6A, the positive and negative gain-control DACs mayalternatively be controlled by separate positive and negative gaincontrol values (pGC[N−1:0] and nGC[N−1:0]) to permit divergent positiveand negative gain settings to be established. Also, thermometer codingmay be used to achieve binary weighting and/or other types of transistorweighting schemes may be used.

Still referring to FIGS. 6A and 6B, both of the variable-gain amplifiersare depicted as being capacitively coupled (i.e., via capacitiveelements 328) to an input signal node 326. The variable-gain amplifiersmay alternatively be directly coupled to the input node in alternativeembodiments. More generally, while specific amplifier implementationshave been described, any amplifier circuit having controllable gain maybe used to implement variable-gain amplifiers within the embodimentsdescribed herein.

FIG. 7 illustrates a more detailed embodiment of a pulse-coded signalreceiver 400 that may be used to implement the pulse-coded signalreceiver 270 of FIG. 5A. Receiver 400 includes a pair of variable-gainamplifiers, 401 and 409, and a corresponding pair of hystereticdetectors, 403 and 411. Amplifier 401 and detector 403, referred toherein as a data amplifier and data detector, correspond to theamplifier 275 and detector 277 of FIG. 5A and, like their counterparts,are used to recover a stream of received data values 278 (Rx Data) froma pulse-coded input signal 274. Amplifier 409 and detector 411 arereferred to herein as a sense amplifier and sense detector and, togetherwith gain control logic 407, form a digital AGC circuit 405. In oneembodiment, the digital AGC circuit 405 establishes a data gain controlvalue 422 (dGC) for the data amplifier 401 by determining a sense gaincontrol value 424 (sGC) that, when applied within the sense amplifier409, results in detection (within the sense detector 411) of half thetotal number of incoming pulses, X, transmitted in a given errordetection interval, and setting the data gain control value 422 to be ascaled version of the sense gain control value, dGC=k×sGC, where k>1.

Referring to FIG. 8, the gain at which half the incoming pulses (X/2)are detected by the sense detector 411 corresponds to an amplificationthat centers the heights of the amplified pulses at the togglethresholds, TT₀₁ and TT₁₀. That is, at the desired sense gain controlsetting, half the pulses exceed a toggle threshold (either TT₀₁ or TT₁₀)and are thus sensed by the sense detector 411 and included within asense pulse count, and half the pulses fall below the toggle threshold(i.e., are less than TT₀₁ or greater than TT₁₀) and are not sensed bythe sense detector 411 and therefore not included within the sense pulsecount. Consequently, as shown by point 435 in FIG. 8, the desired sensegain control setting, referred to herein and shown in FIG. 8 as the 50%setting, in effect, establishes the median pulse height of amplifiedsignal 410 at the toggle threshold of the sense detector 411 and thusprovides a useful measure of the toggle threshold in relation to thesense gain control setting. For example, knowing that the 50% settingyields amplified pulses that just scrape the toggle threshold of sensedetector 411 and that sense detector 411 and data detector 403 shouldhave substantially similar toggle thresholds, the data gain controlvalue 422 may be set as a fixed or programmable multiple of the sensegain control value 424, with the multiple selected to ensure reliabledetection without raising the noise floor of the input signal 274 abovethe toggle threshold. In one embodiment, for example, a scaling factor(i.e., multiplier) of two (2) is applied so that, with substantiallylinear amplification of the input signal 274, the pulse height of theamplified signal 276 should be centered at approximately twice thetoggle threshold of the data detector 403 (i.e., toggle threshold at 50%of the amplified pulse height and thus slices the amplified pulses inhalf).

Returning to FIG. 7, in one embodiment, the gain control logic 407includes data-edge and sense-edge detectors, 415 and 417 (EdgeDet), todetect edges (i.e., transitions) in the received data signal 278 andsense signal 412, respectively, together with data and sense counters,419 and 421 (dCounter and sCounter), to count the edges signaled by theedge detectors 415 and 417. More specifically, data counter 419 countsedge-detect signals 414 from data-edge detector 415, and outputs theresulting data-edge count value 418 to a controller 423 and, similarly,sense counter 421 counts edge-detect signals 416 from sense-edgedetector 417 and outputs the resulting sense-edge count value 420 tocontroller 423. The controller 423, which may be implemented by a statemachine, microcontroller or any other processor or control logic, framesthe error detection intervals, resetting the data and sense counters,419 and 421 (i.e., resetting the data-edge count and sense-edge count tozero), and updating the corresponding gain control values, dGC and sGCat the conclusion of each error detection interval. In the embodimentshown, the gain control memory is included within controller 423, thoughthe gain control memory may be disposed elsewhere in alternativeembodiments.

FIG. 9 illustrates an exemplary flow diagram for operation of thecontroller 423 of FIG. 7. At the start of a gain control update interval(“start AGC”), the controller 423 asserts enable signal 426 to enablethe data counter 419 and sense counter 421 to count edge detectionssignaled by corresponding edge detectors 415 and 417, and resets thedata count (dCnt) and sense count (sCnt) to zero (or some other initialvalue) as shown at 451. Also, as shown at 451, the sense gain controlvalue (sGC) is initialized to a default value and the data gain controlvalue (dGC) is initialized to k times the default value (k*sGC).Thereafter, as shown at 453, the data counter output (i.e., the datacount) is compared with a fixed or programmable terminal count, X, thatestablishes the number of pulses that are to be received within eacherror detection interval. Thus, in the embodiment of FIG. 9, errordetection intervals are framed by detection of a desired number ofpulses within the data detector 403, thus ensuring a sufficient samplepopulation for evaluation of the sense count. In an alternativeembodiment, the error detection interval may be framed by a timeinterval (e.g., a fixed or programmable number of clock cycles) and thedata pulse count accumulated within the time interval compared with athreshold value to ensure sufficient sample population. After the datacounter reaches the terminal count, X, the sense counter and datacounter are disabled at block 455, and the sense count (i.e., content ofthe sense counter) is compared in decision blocks 457 and 461 with avalue, X/2±ε, that corresponds to 50% of the population size (i.e., 50%of the total pulse count) plus or minus a tolerance value, ε. If thesense count is outside the desired range (i.e., tolerance bandestablished by ε and centered around X/2), the sense gain control valueis decremented or incremented by a value n, and the data gain controlvalue is correspondingly decremented or incremented by a value k*n,where k is the scaling factor between the sense and data control values.More specifically, as shown at 457 and 459, if the sense count is abovethe desired range, then the sense gain is deemed to be too high and thesense gain control value is therefore decremented (and the data gaincontrol value correspondingly decremented) at 459. If the sense count isbelow the desired range, then the sense gain is deemed to be too low andthe sense gain control value and data gain control value are incrementedat 463. In one embodiment, the gain control update operation isrepeated, starting at 451, if the sense count is determined to beoutside the desired range in decision blocks 457 or 461. Alternatively,the gain control update operation may be concluded (i.e. at “End AGC”)and then restarted at a later time. For example, the gain control updateoperation shown in FIG. 9 may be executed periodically or occasionallyin response to a control signal from other control logic within the hostintegrated circuit or in response to an instruction or command from aremote device. Similarly, if the sense count falls within the desiredrange, no gain control adjustment is performed and the gain controlupdate may be concluded as shown in FIG. 9 or restarted at 451immediately or after a delay interval.

Still referring to FIG. 9, the tolerance value, ε, establishes adeadband in which the sense gain control value, though not precisely atthe 50% setting, is close enough for gain setting purposes and thus maybe used to inhibit gain control adjustment and thereby avoid unduedither in the data gain control setting and/or unnecessary powerconsumption in the gain control update operation. In one embodiment, thetolerance value is a programmable value (e.g., stored within a volatileor non-volatile storage circuit within the host IC device in response toinstruction from an external system component or production timeprogramming equipment) and may be set to any value extending from zeroto a practicable maximum. In applications where the tolerance value isunnecessary, circuitry and/or programming in support of the tolerancevalue may be omitted.

FIG. 10 illustrates an alternative embodiment of a pulse-coded signalreceiver 470 having a digital AGC circuit 471 that determines a gaincontrol value 422 (GC) in generally the same manner as the digital AGCcircuit 405 of FIG. 7, but through time-multiplexed operation of asingle variable-gain amplifier 275 and hysteretic detector 277 insteadof dual signal detection channels. In the particular embodiment shown,the digital AGC circuit 471 includes an edge detector 415 and counter419 that operate generally as described in reference to FIG. 7. That is,the edge detector 415 detects positive and/or negative transitions inthe received data signal 278 output by the hysteretic detector andasserts a count-enable signal 414 in response to each. The counter 419increments (or decrements) a pulse count 418 in response to thecount-enable signal assertions and thus counts the number of pulsesdetected within the hysteretic detector 277 during a given errordetection interval. The digital AGC circuit 471 additionally includes acontroller 473 which responds to assertion of a calibrate signal 472(e.g., provided from other control circuitry within the host device or aprogrammable storage circuit such as a mode register or the like) bytransitioning from a data-reception mode to a calibration mode. In thecalibration mode, the controller 423 enables operation of the edgedetector and counter (e.g., through assertion of enable signal 426 ormultiple enable signals) and initiates operations to update the gaincontrol value 422, as described in further detail below. In thedata-reception mode, updates to the gain control value 422 are suspendedand components of the digital AGC circuit 471 may be disabled (or notclocked or otherwise prevented from operating) to save power.

In one embodiment, the controller 473 includes separate gain controlmemory circuits 475 and 477 to store a data gain control value, dGC, anda sense gain control value, sGC, respectively. As discussed below, thecontroller 473 alternately selects, via multiplexer 479, either thesense gain control value or the data gain control value to be output asthe gain control value 422 (GC) and applied within the variable-gainamplifier 275 during the calibration and data-reception modes. Morespecifically, in the data-reception mode (i.e., calibrate signal 472deasserted), the data gain control value is supplied to amplifier 275 toestablish a desired level of signal amplification, and duringcalibration mode or at least portions thereof, the sense gain controlvalue is supplied to amplifier 275 to enable determination of the 50%gain control setting described above. As with controller 423 of FIG. 7and all other control circuitry described herein, controller 473 may beimplemented by a state machine, processor (e.g., microcontroller),sequencer or any other type of control circuitry.

FIG. 11 illustrates an exemplary gain control update operation that maybe carried out by the controller 473 of FIG. 10. In one embodiment, thecontroller 473 initiates the gain control update operation upon enteringa calibration mode (i.e., in response to assertion of the calibratesignal 472) and starts at 501 by selecting the sense gain control value(sGC) to be output to the variable-gain amplifier 501. At 503, thecontroller 473 enables and resets the counter 419, for example, byasserting the enable signal 426 shown in FIG. 10 (which may also besupplied to the edge detector 415 to enable edge detection operationtherein). Thereafter, the host integrated circuit device coordinates ornegotiates with a remote device to initiate transmission of a trainingpattern having a predetermined number (X) of pulses. The incoming pulsesare amplified by amplifier 275 to produce amplified signal 276 in whichpulses that are amplified to levels that exceed the toggle threshold ofthe hysteretic detector 277 produce transitions in received data signal278 that are detected by the edge detector 415 and counted by thecounter 419. Accordingly, after the training pattern has beentransmitted (which may be determined by the controller 473, for example,by determining that a predetermined number of clock cycles havetranspired or based on occurrence of other events), the counter 419 isdisabled at 507. The pulse count 418 is then compared with upper andlower bounds of a tolerance band in decision blocks 509 and 513. As inthe embodiment of FIG. 9, if the pulse count 418 exceeds the upper boundof the tolerance band (i.e., >X/2+ε), the sense gain control value isdecremented at by n to reduce the gain of amplifier 275 and the datagain control value is correspondingly decremented by k*n (‘*’ denotingmultiplication) to maintain the scaled relationship between the sensegain control value and data gain control value. This operation is shownin FIG. 10 at 511. Similarly, if the pulse count 418 falls below thelower bound of the tolerance band (i.e., <X/2−ε), the sense gain controlvalue is incremented by n to increase the gain of amplifier 275 and thedata gain control value is correspondingly incremented by k*n as shownat 515. In one embodiment, after adjusting the gain control values ateither 511 or 515, the gain control update operation is repeatedstarting at 503. Alternatively, the gain control update operation may beconcluded by selecting the data gain control value to be output as theapplied gain control value, GC 422 (i.e., as shown at 517 of FIG. 10),thereby enabling iteration of the FIG. 11 gain control update operationto be controlled by other logic within the host integrated circuitdevice, or by a remote device. If the pulse count 418 is determined tofall within the desired range in blocks 509 and 513, neither the sensegain control value nor the data gain control value is updated, and thegain control update operation is concluded by selecting the data gaincontrol value to be output as the applied gain control value (GC) asshown at 517. As in the embodiment of FIG. 9, the gain control updateoperation may alternatively be executed iteratively regardless ofwhether the pulse count falls 418 within or outside the desired range.

Still referring to FIG. 11, in an alternative embodiment the trainingpattern may be transmitted and detected twice per execution of a gaincontrol update operation. For example, the training pattern mayinitially be detected with the data gain control value applied withinamplifier 275, thereby enabling a determination of the number of pulses(X) present in the pattern and/or the length of the training pattern.Thereafter, the training pattern may be detected with the sense gaincontrol value applied within amplifier 275 to determine whether theresulting pulse count falls within the tolerance band (i.e., determinewhether the 50% setting has been reached or nearly reached).

In the signal receiver embodiments of FIGS. 7 and 10, the sense gaincontrol and data gain control may optionally be initialized to nominalvalues, for example in a programming operation in response toinstruction from a remote device. Also, instead of maintaining separatesense and data gain control values, one value may be synthesized fromthe other based on the scaling factor, k, thus obviating separate gaincontrol memories. Further, in the gain update operations described inreference to FIGS. 9 and 11, coarse updates (i.e., coarse or relativelylarge value of n and k*n) may be applied initially to enable rapidadaptation of the sense and data gain control value toward theirultimate setpoints, followed by finer-grained updates (i.e., smallervalues of n and k*n) to enable the desired setpoints to be reached. Thetransition from coarse updates to fine updates may be managed by thecontroller (423 or 473), for example, in response to detecting that thegain control update value is dithering. Further, in an embodiment inwhich positive and negative gain control values are separatelycalibrated, it may be desirable to provide different tolerance bands(i.e., different fixed or programmable values of ε to be applied in thepositive and negative gain control updates), different fixed orprogrammable stepsizes (n and n*k) and/or different fixed orprogrammable scaling factors, k, between the sense and data gain controlvalues. Also, it bears noting that gain control update operations may becarried out simultaneously with reception of live data (i.e., indistinction to test data or training data) in the embodiment of FIG. 7,so that no signaling bandwidth need be consumed to calibrate the gainsetting of the signal receiver 400. On the other hand, in comparison tosignal receiver 400, the signal receiver 470 of FIG. 10 reducescapacitive loading of the signaling link, has a smaller I/O circuitfootprint and avoids calibration errors that might arise due tocomponent variations in the dual detection paths of the FIG. 7embodiment.

FIGS. 12A and 12B illustrate exemplary embodiments of edge detectors 530and 540, respectively, that may be used to implement the data-edge andsense-edge detectors 415 and 417 of FIG. 7 and the edge detector 415 ofFIG. 10. Referring first to FIG. 12A, edge-triggered storage element 531(a flip-flop in this example) and exclusive-OR gate 533 are used togenerate a one-clock-cycle pulse in response to each rising or fallingedge in the output signal 278 from a hysteretic detector. Morespecifically, by clocking flip-flop 531 with a timing signal (not shown)that frames the incoming data reception intervals, if detector outputsignal 278 transitions from low to high, or from high to low, theclock-cycle latency in the output 532 of flip-flop 531 will result in adifference between the signals 278 and 532 supplied to the XOR gate 533over the ensuing clock cycle, and thus the XOR gate 533 will output asingle-cycle pulse that may be detected by the pulse counters describedabove.

FIG. 12B illustrates an embodiment of a multi-mode edge detector 540that provides mode-selectable detection of either falling-edgetransitions, rising-edge transitions, or both falling- and rising-edgetransitions in the hysteretic detector output 278. As shown, edgedetector 540 includes edge-triggered storage element 531 andexclusive-OR gate 533 coupled as described in reference to FIG. 12A, andadditionally includes logic AND gates 541 and 543, each having a firstinput coupled to receive the output 278 of a hysteretic detector and asecond input to receive the latent output of the edge-triggered storageelement 531. The hysteretic detector output 278 is inverted at the firstinput of AND gate 543 so that the output of the AND gate 543 will gohigh only in response to transitions of the detector output 278 that endin a low hysteretic detector output 278 and therefore only in responseto falling-edge transitions. More specifically, during the clock cyclethat follows a falling-edge transition, the high storage-element output532 (i.e., high due to latency by one clock cycle relative to signal278) and low state of signal 278 will cause the output of AND gate 543to go high and thus yield a pulse at the falling-edge input (fe) ofmultiplexer 545 to signal detection of the falling edge. Conversely, theoutput of storage element 531 is inverted at the second input of ANDgate 541 so that the output of AND gate 541 will go high only inresponse to rising-edge transitions of the detector output 278. That is,during the clock cycle that follows a rising edge transition, the lowstorage-element output 532 and high state of signal 278 will cause theoutput of AND gate 541 to go high and thus yield a pulse at therising-edge (re) input of multiplexer 545 to signal detection of therising edge. As discussed, the output of XOR gate 533 will go high forone clock cycle in response to all transitions of the hystereticdetector output 278 and thus will yield a pulse at the all-edge (all)input of multiplexer 545 to signal detection of a rising or fallingedge. The multiplexer 545 responds to an edge-detection mode signal 546(EDM), which may be a programmable value and/or controlled by thecontrollers 423 and 479 of FIGS. 7 and 10 to select either afalling-edge detection mode (i.e., passing the falling-edge detectionsignals from AND gate 543), rising-edge mode detection mode (passing therising-edge detection signals from AND gate 541) or all-edge detectionmode (passing the edge detection signals from exclusive-OR gate 533). Inan alternative embodiment in which multiplexer 545 is implemented by a2,2 And-Or-Invert (AOI) gate, the all-edge input to the multiplexer andexclusive-OR gate may be omitted, and the edge-detection mode signal 546may be supplied to the AOI gate to enable the output of gate 543, theoutput of gate 541, or the outputs of both gates 541 and 543 to appearat the multiplexer output. Other circuits for generating rising-edge,falling-edge and/or all-edge edge-detection signals may be used inalternative embodiments.

Still referring to FIG. 12B, the different edge detection modes may beselected, for example, to enable adaptive calibration of separatepositive and negative gain control values such as those applied withinthe variable-gain amplifiers of FIGS. 6A and 6B (i.e., pGC[N−1:0] andnGC[N−1:0]). That is, to adjust the positive gain control value, theedge detection mode is set to enable detection of rising edges in thehysteretic detector output 278 (i.e., corresponding to high-going pulsesin a pulse-coded input signal) and the operations described in referenceto FIG. 9 or 11, for example, may be carried out to adjust the positivegain control value. After each update to the positive gain controlvalue, the edge detection mode may be switched to enable detection offalling edges in the hysteretic detector output 278 (i.e., correspondingto low-going pulses in the pulse-coded input signal) and the operationsdescribed in reference to FIG. 9 or 11 carried out to adjust thenegative gain control value. By this operation, the positive andnegative gain control values may be alternately updated to establishrespective levels of amplification for positive and negative pulses inthe input signal. In an alternative embodiment, the positive gaincontrol value may be iteratively adjusted to establish a desiredamplification level before iteratively adjusting the negative gaincontrol value, or vice-versa.

In one embodiment, after the positive and negative gain control valueshave been adjusted to achieve desired amplification levels (e.g., sensegain control value yields numbers of positive and negative pulses), theedge detection mode may be switched to select both positive and negativepulses for any further gain control update operations, thus maintainingthe positive and negative gain control values in lock step relative toone another after their initial determination. Alternatively, thepositive and negative gain control values may continue to be separatelyadjusted in periodic or occasional gain control update operations. Inthe latter case, the exclusive-OR gate and corresponding all-edge pathin multiplexer 545 may be omitted from the multi-mode edge detector ofFIG. 12B.

FIGS. 13A and 13B illustrate an alternative technique for adaptively orautomatically determining a gain control value to be applied within avariable-gain amplifier. Referring first to FIG. 13A, which is a plot ofpulse detection versus gain control setting, it can be seen that if thegain control value is stepped through a range from zero to an extremelevel, GC″, that amplifies the noise floor above the toggle-threshold ofthe hysteretic detector, the pulse count obtained within theedge-detect/counter arrangement of FIG. 7 or FIG. 11 will have theprofile shown. That is, the pulse count will be zero or near zero overthe range of gain control values that do not amplify the incoming pulsesabove the toggle-threshold of the hysteretic detector (i.e., gaincontrol range 551). The pulse count begins to rise as the gain controlvalue is increased to a point 552 at which at least some pulses in theincoming signal are amplified above the toggle-threshold, yielding adetermination of the 50% setting (shown as GC/2) when half (X/2) thetotal number of pulses (X) are detected. As the gain control value israised above the 50% setting, the pulse count rapidly rises to a point553, at which all the incoming pulses are amplified above the togglethreshold of the hysteretic detector (i.e., pulse count=X). Continuing,if the gain control value is increased further, at some extreme value ofthe gain control value, GC″, spurious pulses (e.g., noise or othertransients) will begin to be amplified above the toggle threshold of thehysteretic detector, thus yielding a pulse count that exceeds the number(X) of legitimate pulses in the incoming signal. As the gain controlvalue is further raised, noise spikes will increasingly be amplifiedabove the toggle threshold (e.g., as shown at 554) so that the pulsecount will continue to increase until, at some point 555, thetoggle-threshold crossings are so frequent that the toggle bandwidth ofthe hysteretic detector (and/or the maximum edge-detection rate in theedge-detector) is exceeded, in effect saturating the pulse countingcircuitry.

Still referring to FIG. 13A, the range of gain control values for whichfewer than all the incoming pulses are detected (count<X) and for whichmore than all the incoming pulses are detected (count>X), constitutegain ranges in which bit error rates may be quantified according to thedifference between the number of expected pulses and the number ofcounted pulses. In the gain range that yields a pulse count less than X,the bit error rate represents the rate at which valid (legitimate)pulses in the incoming signal are missed (false negatives) and isreferred to as the false-negative rate (FNR). Similarly, in the gainrange that yields a count greater than X, the bit error rate representsthe rate at which undesired (i.e., spurious, non-valid or illegitimate)transitions in the incoming signal are erroneously detected (falsepositives) and is referred to herein as the false-positive rate (FPR).As shown, the false-negative and false-positive rates may be expressedas “count-X” and “X-count,” respectively. Accordingly, thefalse-negative rate represents the number of missed pulses over a giventime interval (i.e., pulses expected less pulses detected) while thefalse-positive rate represents the number of spurious pulses detectedover a given time interval (i.e., pulses detected less pulses expected).In embodiments in which the sample size, X, is variable (e.g.,programmable), the ‘count-X’ and ‘X-count’ values may be divided by X toyield false-negative and false-positive rates that are independent ofthe sample size.

In one embodiment, samples of the false-negative and false-positiverates determined at selected gain control values within thefalse-negative and false-positive gain ranges are used to estimate thefalse-negative and false-positive rates as a functions of the gaincontrol value. In a particular embodiment, illustrated in FIG. 13B, aGaussian bit-error distribution is assumed within the false-negative andfalse-positive gain ranges so that the log of the false-negative andfalse-positive rates determined at selected gain control values withinthose ranges will yield respective sets of error sample points 565 and567, that may applied in statistical determinations of best-fit lines566 and 568 (or other curves) that constitute estimations of thefalse-positive and false-negative rates as a functions of the gaincontrol value. The best-fit lines 566 and 568 have inverse slopes andthus intersect one another at a gain control value 570 (G) that yieldsequal (or balanced or matched) false-negative and false-positive rateestimates. Accordingly, by solving the simultaneous equations for thebest-fit lines 566 and 568 to determine the gain control value 570 thatyields equal false-negative and false-positive rate estimates, a gaincontrol value that, at least in estimation, yields the minimum total biterror rate may be determined. Specifically, as the false-negative andfalse-positive error rate estimates may be expressed analytically bylog(FNR)=m1(GC)+b1 and log(FPR)=m2(GC)+b2, respectively, (m1 and m2being the slopes and b1 and b2 being the y-intercepts of best-fit linesas shown in FIG. 13B) the gain control value, GC, that yields theestimated minimum bit error rate may be determined as:GC_(minBER)=(b2−b1)/(m1−m2). Where other best-fit curve functions areapplied (e.g., where bit error rates are more accurately modeled bynon-Gaussian expressions), other combinations of curve coefficients maybe combined to generate the GC_(minBER) value.

FIG. 14 illustrates an exemplary approach that may be applied within thesignal receiver 400 of FIG. 7 to determine a gain control value at whichestimated false-negative and false-positive rates balance. At 601, thedata gain control value (dGC, the gain control value applied within dataamplifier 401 of FIG. 7) is initialized to a nominal value, Nom, and thesense gain control value (sGC, the gain control value applied withinsense amplifier 409) is initialized to a value sufficiently below 50% ofthe nominal value (i.e., <Nom/2) to ensure that the sense gain controlvalue may be incrementally stepped through a false-negative gain region.A count value, NumPoints, is also initialized to zero. At 603, the datacounter and sense counter (i.e., elements 419 and 421 of FIG. 7) areenabled and the sense and data counts therein reset to zero or anotherinitial value (e.g., dCnt=0, sCnt=0). The data and sense counters remainenabled to count data and sense signal transitions until the datacounter reaches a terminal count value, X, as indicated by decisionblock 605 and the negative branch back to the decision block 605 input.At 607, the sense and data counters are disabled, and at decision block609, the sense count is evaluated to determine if at least some pulsesin the input signal have been detected by the sense detector (i.e.,sCnt>0 ?) and, thus, whether a gain-sensitive region of thefalse-negative gain range has been reached. If no pulses have beendetected by the sense detector, the sense gain control value isincremented by value n to raise the gain of the sense amplifier towardthe gain-sensitive region. Note that, while not specifically shown, thesense count may also be compared with X to ensure that the sense gaincontrol value is not beyond the false-negative gain range (i.e., sCnt<X)and, if so, to decrease the gain control value. Also, in one embodiment,the terminal count value, X (which may be a programmable value), may beadapted according to the false-negative rate. That is, if thefalse-negative rate is determined to be low, the value of X (i.e., thesample size) may be increased to obtain a statistically more meaningfulmeasurement.

Still referring to FIG. 14, if the sense count indicates that the senseamplifier gain is within the gain-sensitive region of the false-negativegain range (e.g., 0<sCnt<X), the sense gain control value is recorded at613 along with a log of the false-negative error rate, log (X−sCnt), ina table of false-negative rate measurements (e.g., an array, structureor other data storage arrangement) and a count of the number offalse-negative measurements, NumPoints, is incremented. As discussedabove, the ‘X−sCnt’ value may be divided by X to yield a false-negativeerror rate that is independent of the sample size, X. At decision block615, the measurement count, NumPoints, is evaluated to determine if athreshold number (Thresh, which may be a fixed or programmable value) offalse-negative measurements have been recorded. If not, the sense gaincontrol value is incremented by a gain-step value (step) at 617 and theoperations starting at 603 are repeated to obtain another error ratemeasurement in the false-negative gain range. If a threshold number ofmeasurements have been recorded (i.e., NumPoints greater than or equalto Thresh), the slope (m1) and intercept (b1) of a best-fit line throughthe recorded false-negative measurements (i.e., points) is determined at619, for example, using linear regression or other curve-fittingtechniques. Note that, instead of determining whether a threshold numberof measurements have been recorded, false-negative measurements maycontinue to be obtained for progressively increased sense gain controlvalues until no false-negatives are detected. Also, curves other thanlines may be fit to the recorded measurements in alternativeembodiments, and the best-fit curve may be determined iteratively, forexample, with outlier removal after each determination of curvecoefficients followed by repetition of the best-fit determinationwithout the outlier measurement(s). In cases where outlier removalleaves an insufficient measurement population (i.e., insufficient numberof measurements), the operations starting at 603 may be repeated toobtain additional false-negative rate measurements.

After the coefficients of a best-fit curve are determined (i.e., slopeand intercept of a line in FIG. 14), the measurement count, NumPoints,is reset to zero at block 623 and the sense gain control value is set toa value greater than the nominal receiver gain (i.e., >Nom) inpreparation for error rate measurements in the false-positive gainrange. Thus, at 625, the data counter and sense counter are enabled andreset, and allowed to count pulse detections until the data counterreaches a terminal count value, X (determined at decision block 627).After the data counter reaches the terminal count value, the datacounter and sense counter are disabled at 629, and the sense countcompared with the terminal count at 631 to determine whether anyfalse-positive detections occurred (i.e., whether sCnt>X) and thuswhether the false-positive gain range has been entered. If not, then thesense gain control value is incremented at 633 by a value n (which maybe the same or different from the increment applied in block 611), andthe operations starting at block 625 repeated to generate a new sensecount at the increased gain control value. Note that, while notspecifically shown, the sense count may also be compared with asaturation value (S) that represents the maximum possible count that mayhave been reached during the error detection interval to ensure that thesense gain control value remains within a gain-sensitive region of thefalse-positive gain range (i.e., sCnt<S) and, if not, to decrease thesense gain control value to find the start of the false-positive gainrange.

Still referring to FIG. 14, if the sense count indicates that the senseamplifier gain is within the gain-sensitive region of the false-positivegain range (e.g., X<sCnt<S), the sense gain control value is recorded at635 along with a log of the false-positive error rate, log (sCnt−X), ina table of false-positive rate measurements, and a count of the numberof false-positive rate measurements, NumPoints, is incremented. Asdiscussed above, the ‘sCnt−X’ value may be divided by X to yield afalse-positive error rate that is independent of the sample size, X. At637, the number of recorded measurements is evaluated to determine if athreshold number of false-positive rate measurements (Thresh, which maybe the same or different from the threshold applied in block 615 havebeen recorded. If not, the sense gain control value is incremented by again-step value at 639 (i.e., incremented by a value, step, which alsomay be the same or different from the step size applied at 617) and theoperations starting at 625 repeated to obtain another error ratemeasurement in the false-positive gain range. If a threshold number ofmeasurements have been recorded (i.e., NumPoints greater than or equalto Thresh), the slope (m2) and intercept (b2) of a best-fit line throughthe recorded false-positive measurements (i.e., points) is determined at641. As discussed, curves other than lines may be fit to the recordedmeasurements in alternative embodiments, and/or the best-fit curve maybe determined iteratively (e.g., with outlier removal and repetition ofbest-fit determination and, if necessary, repetition of the measurementoperations starting at 625 to obtain additional measurements).

At 643, after coefficients of best-fit lines or other curves for thefalse-negative and false-positive error rate measurements have beendetermined, the coefficients are applied to determine an operating gaincontrol value, GC_(BPN), that balances the estimated false-positive andfalse-negative error rates (i.e., represented by the best-fit curves).More specifically, in the embodiment of FIG. 14, the operating gaincontrol value is assigned the value at which the best-fit curves yieldequal bit error rates (i.e., the intersection point of the two best-fitcurves) which, in the case of linear best-fit curves may be determinedby: GCBPN=(b1−b2)/(m2−m1). As shown at 645, the operating gain controlvalue may optionally be boundary checked to ensure that is within fixed,programmed or computed boundaries (i.e., to ensure that an out-of-rangegain control value is not applied within the data amplifier), and isthen output to the data amplifier as the data gain control value, dGC.

Although described in the context of the dual-detector signal receiverof FIG. 7, it should be noted that the overall gain controldetermination operation of FIG. 14 may also be carried out within asingle-detector signal receiver of FIG. 10, for example, by leveragingthe training pattern techniques described in reference to FIG. 11. Thus,the measurement operations at blocks 603-607 and 625-629 of FIG. 14 mayalternatively be carried out using the operations described in referenceto blocks 503-507 of FIG. 11. Also, the gain control determinationoperation of FIG. 14 may be separately executed in conjunction withpositive transition detection (i.e., as described in reference to FIG.12B) to determine a positive gain control value, and then in conjunctionwith negative transition detection to establish a negative gain controlvalue. Thereafter, the gain control operation of FIG. 14 may beperiodically or occasionally repeated to compensate for run-time changesin voltage or temperature or other sources of drift.

It should be noted that the various circuits disclosed herein may bedescribed using computer aided design tools and expressed (orrepresented), as data and/or instructions embodied in variouscomputer-readable media, in terms of their behavioral, registertransfer, logic component, transistor, layout geometries, and/or othercharacteristics. Formats of files and other objects in which suchcircuit expressions may be implemented include, but are not limited to,formats supporting behavioral languages such as C, Verilog, and VHDL,formats supporting register level description languages like RTL, andformats supporting geometry description languages such as GDSII, GDSIII,GDSIV, CIF, MEBES and any other suitable formats and languages.Computer-readable media in which such formatted data and/or instructionsmay be embodied include, but are not limited to, non-volatile storagemedia in various forms (e.g., optical, magnetic or semiconductor storagemedia) and carrier waves that may be used to transfer such formatteddata and/or instructions through wireless, optical, or wired signalingmedia or any combination thereof. Examples of transfers of suchformatted data and/or instructions by carrier waves include, but are notlimited to, transfers (uploads, downloads, e-mail, etc.) over theInternet and/or other computer networks via one or more data transferprotocols (e.g., HTTP, FTP, SMTP, etc.).

When received within a computer system via one or more computer-readablemedia, such data and/or instruction-based expressions of the abovedescribed circuits may be processed by a processing entity (e.g., one ormore processors) within the computer system in conjunction withexecution of one or more other computer programs including, withoutlimitation, net-list generation programs, place and route programs andthe like, to generate a representation or image of a physicalmanifestation of such circuits. Such representation or image maythereafter be used in device fabrication, for example, by enablinggeneration of one or more masks that are used to form various componentsof the circuits in a device fabrication process.

In the foregoing description and in the accompanying drawings, specificterminology and drawing symbols have been set forth to provide athorough understanding of the present invention. In some instances, theterminology and symbols may imply specific details that are not requiredto practice the invention. For example, the interconnection betweencircuit elements or circuit blocks may be shown or described asmulti-conductor or single conductor signal lines. Each of themulti-conductor signal lines may alternatively be single-conductorsignal lines, and each of the single-conductor signal lines mayalternatively be multi-conductor signal lines. Signals and signalingpaths shown or described as being single-ended may also be differential,and vice-versa. Similarly, signals described or depicted as havingactive-high or active-low logic levels may have opposite logic levels inalternative embodiments. As another example, circuits described ordepicted as including metal oxide semiconductor (MOS) transistors mayalternatively be implemented using bipolar technology or any othertechnology in which logical elements may be implemented. With respect toterminology, a signal is said to be “asserted” when the signal is drivento a low or high logic state (or charged to a high logic state ordischarged to a low logic state) to indicate a particular condition.Conversely, a signal is said to be “deasserted” to indicate that thesignal is driven (or charged or discharged) to a state other than theasserted state (including a high or low logic state, or the floatingstate that may occur when the signal driving circuit is transitioned toa high impedance condition, such as an open drain or open collectorcondition). A signal driving circuit is said to “output” a signal to asignal receiving circuit when the signal driving circuit asserts (ordeasserts, if explicitly stated or indicated by context) the signal on asignal line coupled between the signal driving and signal receivingcircuits. A signal line is said to be “activated” when a signal isasserted on the signal line, and “deactivated” when the signal isdeasserted. Additionally, the prefix symbol “/” attached to signal namesindicates that the signal is an active low signal (i.e., the assertedstate is a logic low state). A line over a signal name (e.g., ‘ <signalname>’) is also used to indicate an active low signal. The term“coupled” is used herein to express a direct connection as well as aconnection through one or more intervening circuits or structures. Theterm “exemplary” is used to express an example, not a preference orrequirement.

While the invention has been described with reference to specificembodiments thereof, it will be evident that various modifications andchanges may be made thereto without departing from the broader spiritand scope of the invention. For example, features or aspects of any ofthe embodiments may be applied in combination with any other of theembodiments or in place of counterpart features or aspects thereof.Accordingly, the specification and drawings are to be regarded in anillustrative rather than a restrictive sense.

1. An integrated circuit device comprising: a variable-gain amplifier togenerate an amplified signal having an amplitude according to a gaincontrol value; a memory circuit to both store the gain control value andprovide the gain control value to the variable-gain amplifier during afirst interval; and an update circuit to generate an updated gaincontrol value based on the amplified signal during the first interval,and to output the updated gain control value to the memory circuit. 2.The integrated circuit device of claim 1 wherein the gain control valuecomprises an analog gain control signal and wherein the variable-gainamplifier includes circuitry that amplifies an input signal inaccordance with the analog gain control signal to generate the amplifiedsignal.
 3. The integrated circuit device of claim 2 wherein the memorycircuit comprises a storage element to store a digital control word thatcorresponds to the analog gain control signal and a digital-to-analogconverter to generate the analog gain control signal based on thedigital control word.
 4. The integrated circuit device of claim 3wherein the updated gain control value comprises an analog update signaland wherein the memory circuit further comprises an analog-to-digitalconverter to generate, based on the analog update signal, an updateddigital control word to be stored in the storage element and provided tothe digital-to-analog converter during an interval subsequent to thefirst interval.
 5. The integrated circuit device of claim 1 wherein theupdate circuit comprises an input to receive an inhibit signal, andwherein the update circuit is enabled to generate the updated gaincontrol value when the inhibit signal is in a first state and inhibitedfrom generating the updated gain control value when the inhibit signalis in the second state.
 6. The integrated circuit device of claim 5wherein the memory circuit includes an input to receive a load-enableindication, a storage element to store the gain control value and loadcircuitry to load the updated gain control value into the storageelement in place of the gain control value in response to theload-enable indication, the integrated circuit device further comprisinga control circuit to output the inhibit signal in the first state duringthe first interval and to generate the load-enable indication at theconclusion of the first interval.
 7. The integrated circuit device ofclaim 6 wherein the control circuit is configured to output the inhibitsignal in the second state after conclusion of the first interval. 8.The integrated circuit device of claim 6 wherein the inhibit signal issupplied to the memory circuit as the load-enable indication, andwherein the control circuit is configured to transition the inhibitsignal from the first state to the second state to generate theload-enable indication.
 9. The integrated circuit device of claim 1wherein the update circuit comprises a detector to detect an amplitudeof the amplified signal and a comparator to compare the amplitude of theamplified signal with a desired amplitude, the comparator having anoutput to output an error signal that indicates whether the amplitude ofthe amplitude of the amplified signal exceeds the desired amplitude. 10.The integrated circuit device of claim 9 further comprising aprogrammable storage circuit to store a value that represents thedesired amplitude.
 11. The integrated circuit of claim 9 furthercomprising an analog-to-digital converter to convert the amplifiedsignal into a sequence of digital samples, and wherein the detectorcomprises a digital detector to detect a peak digital sample of thedigital samples, and wherein the comparator comprises a digitalcomparator circuit to compare the peak digital sample with a digitalvalue that represents the desired amplitude.
 12. The integrated circuitdevice of claim 9 further comprising a programmable storage circuit tostore the digital value that represents the desired amplitude.
 13. Anintegrated circuit device comprising: a variable-gain amplifier togenerate an amplified signal having an amplitude according to a digitalgain control value; and digital gain control circuitry to generate asequence of digital samples that corresponds to the amplified signal,and to iteratively adjust the digital gain control value based on thesequence of digital samples.
 14. The integrated circuit device of claim13 wherein the digital gain control circuitry comprises an inhibit inputto receive an inhibit signal, and wherein digital gain control circuitryis enabled to adjust the digital gain control when the inhibit signal isin a first state inhibited from adjusting the digital gain control valuewhen the inhibit signal is in a second state.
 15. The integrated circuitdevice of claim 13 wherein the digital gain control circuitry comprises:a memory circuit to both store the digital gain control value andprovide the digital gain control value to the variable-gain amplifierduring a first interval; an analog-to-digital converter to generate thesequence of digital samples based on the amplified signal; and an updatecircuit to generate an updated digital gain control value during thefirst interval based on the sequence of digital samples, and to outputthe updated digital gain control value to the memory circuit to bestored therein at the conclusion of the first interval.
 16. Theintegrated circuit device of claim 15 wherein the update circuitcomprises: a digital detector to detect a peak digital sample within thesequence of digital samples; and a digital comparator circuit to comparethe peak digital sample with a digital value that represents a desiredsignal amplitude.
 17. The integrated circuit device of claim 13 whereinthe amplified signal is an amplified pulse-mode signal having arespective pulse for each change in state within a sequence of transmitdata bits, and wherein the digital gain control circuitry furthercomprises a first detector to detect pulses in the amplified pulse-modesignal that exceed a first threshold and to toggle a received datasignal between binary states in response to detecting pulses in theamplified pulse-mode signal.
 18. The integrated circuit device of claim17 wherein the digital gain control circuitry further comprises a seconddetector to detect pulses in the amplified pulse-mode signal that exceeda second threshold, the second threshold being higher than the firstthreshold.
 19. The integrated circuit device of claim 18 wherein thedigital gain control circuitry further comprises logic circuitry toadjust the digital gain control value based, at least in part, on acomparison of a number of pulses detected by the first detector and anumber of pulses detected by the second detector.
 20. The integratedcircuit device of claim 19 wherein the logic circuitry includes acontroller to increase the digital gain control value if the number ofpulses detected by the second detector is less than a firstpredetermined fraction of the number of pulses detected by the firstdetector, and to decrease the digital gain control value if the numberof pulses detected by the second detector is greater than a secondpredetermined fraction of the number of pulses detected by the firstdetector.
 21. The integrated circuit device of claim 20 wherein thefirst predetermined fraction is equal to a predetermined percentage ofthe number of pulses detected by the first detector less a tolerancevalue, and wherein the second predetermined fraction is equal to thepredetermined percentage of the number of pulses detected by the firstdetector plus the tolerance value, and wherein the tolerance valueranges from zero to a maximum tolerance value.
 22. A method of operationwithin an integrated circuit device, the method comprising: generating,during a first interval, an amplified signal having an amplitudeaccording to a first gain control value stored within a storage circuit;generating a second gain control value based on the amplified signal;and storing the second gain control value in the storage circuit inplace of the first gain control value at the conclusion of the firstinterval.
 23. The method of claim 22 further comprising disablingcircuitry used to generate the second gain control value after thesecond control value is stored in the storage circuit.
 24. The method ofclaim 22 wherein generating the second control value based on theamplified signal comprises generating a sequence of digital values thatcorrespond to the amplified signal and generating the second controlvalue based on the sequence of digital values.
 25. A method of operationwithin an integrated circuit device, the method comprising: generatingan amplified signal having an amplitude according to a digital gaincontrol value; generating a sequence of digital samples that correspondsto the amplified signal; and iteratively adjusting the digital gaincontrol value based on the sequence of digital samples.
 26. The methodof claim 25 wherein iteratively adjusting the digital gain control valuecomprises: storing the digital gain control value in a storage circuitduring a first interval; generating an adjusted digital gain controlvalue based on the sequence of digital samples during the firstinterval; and storing the adjusted digital gain control value in thestorage circuit at the conclusion of the first interval.
 27. The methodof claim 26 wherein generating an adjusted digital gain control valuecomprises: detecting a peak digital sample within the sequence ofdigital samples; and comparing the peak digital sample with a digitalvalue that represents a desired signal amplitude.
 28. The method ofclaim 25 wherein further comprising selectively inhibiting iterativeadjustment of the digital gain control value.
 29. The method of claim 28wherein selectively inhibiting iterative adjustment of the digital gaincontrol value comprises: determining whether the amplitude of theamplified signal is within a desired range; and inhibiting iterativeadjustment of the digital gain control value in response to determiningthat the amplitude is within the desired range.
 30. The method of claim29 wherein determining whether the amplitude is within the desired rangecomprises periodically determining whether the amplitude is within thedesired range.
 31. A method of operation within an integrated circuitdevice, the method comprising: amplifying an input signal in accordancewith a first gain control value to generate a first amplified signal;iteratively adjusting the first gain control value until a desirednumber of transitions in the first amplified signal are determined tocross a threshold; generating a second gain control value based on thefirst gain control value; and amplifying the input signal in accordancewith the second gain control value to generate a second amplifiedsignal; and generating a sequence of received data values based ontransitions in the second amplified signal.
 32. The method of claim 31wherein the threshold includes upper and lower thresholds, and whereiniteratively adjusting the first gain control value until a desirednumber of transitions in the first amplified signal are determined tocross a threshold comprises: determining a first number of positivegoing transitions that cross the upper threshold and a second number ofnegative going transitions that cross the lower threshold; anditeratively adjusting the first gain control value until a sum of thefirst number and the second number fall within a desired range.
 33. Themethod of claim 31 wherein generating the second gain control valuebased on the first gain control value comprises generating a second gaincontrol value that is different from the first gain control value andthat bears a predetermined mathematical relationship to the first gaincontrol value.
 34. A method of determining a gain to be applied within avariable-gain amplifier of a signal receiver, the method comprising:estimating a first bit error rate as a function of the gain appliedwithin the variable-gain amplifier by determining respective numbers ofnon-detected input signal transitions at corresponding values of thegain; estimating a second bit error rate as a function of the gainapplied within the variable-gain amplifier by determining respectivenumbers of spurious input signal transitions at corresponding values ofthe gain; and determining an operating gain at which the first bit errorrate and the second bit error rate are substantially balanced.
 35. Themethod of claim 34 wherein determining an operating gain at which thefirst bit error rate and the second bit error rate are substantiallybalanced comprises: generating coefficients of a first polynomialfunction of gain that corresponds to the numbers of non-detected inputsignal transitions and corresponding values of the gain; generatingcoefficients of a second polynomial function of gain that corresponds tothe numbers of spurious input signal transitions and correspondingvalues of the gain; and determining, as the operating gain, the gain atwhich the first and second polynomial functions yield matching bit errorrates.
 36. An integrated circuit device comprising: means for storing again control value; means for generating, during a first interval, anamplified signal having an amplitude according to a first gain controlvalue stored within the means for storing; means for generating a secondgain control value based on the amplified signal; and means for loadingthe second gain control value into the means for storing in place of thefirst gain control value at the conclusion of the first interval. 37.Computer-readable media having information embodied therein thatincludes a description of an integrated-circuit memory device, theinformation including descriptions of: a variable-gain amplifier togenerate an amplified signal having an amplitude according to a gaincontrol value; a memory circuit to both store the gain control value andprovide the gain control value to the variable-gain amplifier during afirst interval; and an update circuit to generate an updated gaincontrol value based on the amplified signal during the first interval,and to output the updated gain control value to the memory circuit.